Quantum Metrology, Imaging, and Communication

· ·
· Springer
電子書
273
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關於本電子書

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

關於作者

David Simon. Professor, Stonehill College, Easton MA 02357, USA

Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA

Alexander V. Sergienko, Boston University, Boston MA 02215, USA

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