Multi-Chip Module Test Strategies

· Frontiers in Electronic Testing Kitabu cha 7 · Springer Science & Business Media
Kitabu pepe
167
Kurasa
Ukadiriaji na maoni hayajahakikishwa  Pata Maelezo Zaidi

Kuhusu kitabu pepe hiki

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.
Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain.
Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

Kadiria kitabu pepe hiki

Tupe maoni yako.

Kusoma maelezo

Simu mahiri na kompyuta vibao
Sakinisha programu ya Vitabu vya Google Play kwa ajili ya Android na iPad au iPhone. Itasawazishwa kiotomatiki kwenye akaunti yako na kukuruhusu usome vitabu mtandaoni au nje ya mtandao popote ulipo.
Kompyuta za kupakata na kompyuta
Unaweza kusikiliza vitabu vilivyonunuliwa kwenye Google Play wakati unatumia kivinjari cha kompyuta yako.
Visomaji pepe na vifaa vingine
Ili usome kwenye vifaa vya wino pepe kama vile visomaji vya vitabu pepe vya Kobo, utahitaji kupakua faili kisha ulihamishie kwenye kifaa chako. Fuatilia maagizo ya kina ya Kituo cha Usaidizi ili uhamishe faili kwenye visomaji vya vitabu pepe vinavyotumika.