Modern Characterization of Electromagnetic Systems and its Associated Metrology
Осы электрондық кітап туралы ақпарат
Modern Characterization of Electromagnetic Systems introduces a new method of characterizing electromagnetic wave dynamics and measurements based on modern computational and digital signal processing techniques. The techniques are described in terms of both principle and practice, so readers understand what they can achieve by utilizing them.
Additionally, modern signal processing algorithms are introduced in order to enhance the resolution and extract information from electromagnetic systems, including where it is not currently possible. For example, the author addresses the generation of non-minimum phase or transient response when given amplitude-only data.
- Presents modern computational concepts in electromagnetic system characterization
- Describes a solution to the generation of non-minimum phase from amplitude-only data
- Covers model-based parameter estimation and planar near-field to far-field transformation as well as spherical near-field to far-field transformation
Modern Characterization of Electromagnetic Systems is ideal for graduate students, researchers, and professionals working in the area of antenna measurement and design. It introduces and explains a new process related to their work efforts and studies.
Авторы туралы
TAPAN K. SARKAR, PhD, is a professor at the Department of Electrical Engineering and Computer Science at Syracuse University, NY, USA. Professor Sarkar has previously published seven books with Wiley.
MAGDALENA SALAZAR-PALMA, PhD, is a professor at the Department of Signal Theory and Communications, Carlos III University of Madrid, Leganes, Madrid, Spain.
MING DA ZHU, PhD, is an associate professor at the School of Electronic Engineering at Xidian University, Xi’an, Shaanxi, China.
HENG CHEN, PhD, is a research assistant at the Department of Electrical Engineering and Computer Science at Syracuse University, NY, USA.
