ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis
ASM International
Dec 2017 · ASM International
Ebook
665
Pages
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About this ebook
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
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